The MWI HHArch24 is a compact, portable Gaussian-beam reflection-loss measurement fixture designed for localized non-destructive material characterization. Its compact architecture extends laboratory-style reflectivity and surface-impedance measurements to applications where larger fixed test fixtures are impractical.

Flexible Measurement Configurations
The HHArch24 architecture supports both portable localized measurements and integration into configurable
automated measurement platforms.

Portable: Optimized for localized measurements and rapid comparative testing.

Automated Platform Integration: The measurement architecture can be incorporated into configurable
positioning systems for repeatable surface mapping and larger-area characterization.

Designed for engineering, research, and quality teams requiring localized electromagnetic characterization of
composite materials, engineered coatings, and other advanced material systems.