The MWI Conductive Sheet Testing Solution is a high-speed, 2-port NDT platform designed to characterize the surface resistance and transmission loss of conductive and resistive materials. Optimized for R-Cards, shielding films, and lossy sheets, this system provides a direct measurement of the in-plane (X or Y directed) electric field. This allows for the precise extraction of sheet resistance (Ohms/sq) and the detection of material anisotropy across a broad frequency spectrum.

A Proprietary End-to-End Metrology Solution

This system is not a standalone hardware accessory. To achieve its industry-leading accuracy and dynamic range, it requires the MWI Proprietary Calibration and Data Reduction Suite. This specialized software environment performs complex gating and post-collection processing to isolate the material’s true properties from environmental variables, ensuring that simulated models and real-world results correlate with near-perfect linearity.

Key Technical Specifications

• Broadband Performance: Operates continuously from 1 GHz to 20 GHz.
• High-Resolution Spot Size: Measures a localized zone of < 3 inches, enabling detailed uniformity mapping of large sheets.
• Massive Dynamic Range: Accurately resolves sheet resistance from 10m Ohm/sq to 10M Ohm/sq, and transmission losses from 0.01 dB to 10 dB.
• Simultaneous Dual-Polarization: Captures X and Y components independently to characterize material anisotropy (grain or weave directionality) in a single pass.

Operational Advantages

• Edge-to-Edge Accuracy: Requires only 1.5 inches of edge clearance, maximizing the testable area of production samples.
• Production Speed: Engineered to match the sweep speeds of modern VNAs, making it an ideal candidate for in-line quality control.
• Compact Integration: The small-footprint probe heads are designed for easy integration into existing sheet-processing machinery or MWI Robotic XYZ-Scanners.

Primary Utility

The premier choice for manufacturers of aerospace R-Cards, high-performance EMI shielding, and conductive thin films who require laboratory-grade Ohms/sq verification in a high-throughput production environment.