The MWI OSR (Open Stripline Resonator) Series is a highly specialized, customizable NDT platform for characterizing the out-of-plane electromagnetic properties of dielectric materials. Unlike traditional “closed” fixtures that require specific sample shapes, the OSR features an Open Architecture. This allows for the measurement of samples with arbitrary X-Y dimensions, enabling the test head to be moved across large panels or integrated into automated scanning lines.

Precision Z-Axis Characterization The OSR is engineered to measure the z-directed electric field. This provides critical data on the dielectric constant (Dk) and dissipation factor (Df) in the direction most relevant to high-speed signal propagation in PCB laminates and aerospace composites.

A Customizable Engineering Platform The OSR is not a “one-size-fits-all” device. Every system is mathematically and mechanically optimized based on the user’s specific requirements:

• Frequency-Optimized Design: Base configurations typically cover 500 MHz to 40 GHz, with specialized custom heads available up to 80 GHz.
• Material-Specific Scaling: The test head dimensions and strip geometries are scaled to the thickness and expected loss profile of the target material.
• Extreme Low-Loss Sensitivity: Capable of resolving ultra-low dissipation factors down to 0.00005, making it the premier choice for the next generation of high-frequency substrates.
• Flexible Integration: * Stationary Head: Move the material under the resonator for batch testing.
  • Mobile Head: Move the mechanical/electrical unit over a stationary panel for localized “spot-checking.”

Technical Advantages

• Minimal Edge Requirements: Accurate measurements can be taken as close as 1 cm from the edge of the material.
• Uncoupled Data Extraction: Advanced MWI algorithms ensure that remains stable even as fluctuates, providing pure material property data.
• Non-Destructive Interface: The “Open” design eliminates the need for cutting coupons, preserving the integrity of expensive production panels.

Primary Utility

The OSR Series is the definitive solution for PCB material developers, satellite component manufacturers, and NDE specialists who require high-accuracy, Z-axis characterization for materials ranging from standard laminates to ultra-low-loss 6G substrates.