MWI Automated Measurement Platforms provide configurable solutions for repeatable material characterization
across larger sample areas.

Moving beyond legacy eddy-current sensors, these systems utilize MWI’s advanced broadband probes to provide high-resolution mapping of dielectric and conductive properties. Built around a “Virtual Dielectric” net table, these scanners eliminate environmental interference, allowing for laboratory-grade Dk, Df, conductivity, and Ohms/sq measurements across large-scale industrial panels.

Versatile Mechanical Architectures

To accommodate varying production footprints and material weights, MWI scanners are available in two primary configurations:

• XY-Moving Net Table: The probes remain stationary while the material is precisely translated through the test zone. Ideal for high-speed “down-web” inspection of flexible films and lightweight sheets.
• Multi-Axis Positioning Platform: A configurable measurement platform can support multiple test methods. System configurations can be scaled to accommodate different sample dimensions and laboratory requirements.

Multi-Modality Inspection

Unlike single-purpose scanners, the MWI platform is a multi-tool environment. A single robotic frame can be configured for:

• Admittance Tunnel Scanning: Automated volumetric characterization of thick slabs and cores.
• Focused Reflection Mapping: High-frequency analysis of specialized coatings and engineered surfaces.
• Near-Field Sensing: Ultra-localized flaw detection and Ohms/sq mapping for R-cards and conductive films.

Key Technical Advantages

• Instrument Agnostic: Fully compatible with all industry-standard Vector Network Analyzers (VNAs).
• Scalable Test Regions: Available in footprints ranging from compact lab units to massive 16ft x 28ft industrial installations.
• Precision Gap Control: Automated Z-axis adjustment maintains a constant standoff distance, ensuring data integrity across contoured or non-planar surfaces.
• High-Speed Data Correlation: Synchronized with the MWI Data Reduction Suite to generate real-time spatial “heat maps” of material performance.

Primary Utility

Suitable for larger rigid samples, composite panels, and engineered core materials. Designed for repeatable characterization of composite panels, engineered core materials, shielding materials, and other advanced material systems.